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AFM STANDARD PROBES

We offer a wide range of AFM probes with various functionalities to suit diverse applications and imaging needs.

Cantilevers for non-cantact/semi-contact mode

HA Series High-Precision AFM Probes

The HA series offers a variety of high-precision AFM probes designed for semi-contact, non-contact, and force modulation modes. Each chip features two cantilevers, ensuring reliable performance across different applications. Key specifications are as follows:

  • HA_CNC Series: Ideal for semi-contact and non-contact modes, with resonance frequencies of 66 kHz and 46 kHz, and force constants of 1.5 N/m and 1.0 N/m. Available with gold (Au) reflective coating, uncoated and conductive-coated options.
  • HA_FM Series: Optimized for force modulation, with resonance frequencies of 114 kHz and 77 kHz, and force constants of 6 N/m and 3.5 N/m. Features gold (Au) coating, with uncoated and conductive-coated variants.
  • HA_HR Series: High resonance frequencies (380 kHz and 230 kHz) for fast and stable imaging, with force constants of 34 N/m and 17 N/m. Gold (Au) reflective coating, uncoated and conductive-coated versions available.
  • HA_NC Series: Designed for semi-contact and non-contact modes, with resonance frequencies of 235 kHz and 140 kHz, and force constants of 12 N/m and 3.5 N/m. Gold (Au) reflective coating, with uncoated and conductive-coated options.

NSG Series High-Resolution AFM Cantilevers

The NSG series offers high-resolution silicon AFM cantilevers designed for semi-contact and non-contact scanning modes. Each series features a range of resonance frequencies and force constants, making them suitable for various AFM applications. Key specifications include:

  • NSG01 Series: Resonance frequency of 150 kHz (range: 87-230 kHz), force constant of 5.1 N/m (range: 1.45-15.1 N/m). Gold (Au) reflective coating, with uncoated and conductive-coated options.
  • NSG03 Series: Resonance frequency of 90 kHz (range: 47-150 kHz), force constant of 1.74 N/m (range: 0.35-6.1 N/m). Gold (Au) reflective coating, with uncoated and conductive-coated variants.
  • NSG10 Series: Resonance frequency of 240 kHz (range: 140-390 kHz), force constant of 11.8 N/m (range: 3.1-37.6 N/m). Gold (Au) reflective coating, with uncoated and conductive-coated options.
  • NSG30 Series: Resonance frequency of 320 kHz (range: 240-440 kHz), force constant of 40 N/m (range: 22-100 N/m). Gold (Au) reflective coating, with uncoated and conductive-coated variants.

Contact us to learn more or get a recommendation for your specific needs.

SILICON TERS PROBES

Unlock nanoscale chemical analysis with our advanced TERS probes, specially designed for AFM-Raman systems equipped with a Top Visual console. These gold-coated, sharp-tip probes enable Tip-Enhanced Raman Spectroscopy (TERS) in contact mode, delivering simultaneous topographic imaging and localized chemical characterization with nanometer precision.

Optimized for performance on standard TERS test samples (organic molecules on a gold substrate), our probes offer:

  • Raman Signal Enhancement: >50× (Tip IN vs. Tip OUT) for ~70% of probes. Typical gains exceed 100×, with some reaching >500×.
  • High Spatial Resolution: Achieve ~20–70 nm resolution in Nano-Raman mapping with more than 50% of probes.
  • Reliable Durability: Stable performance and long service life with minimal signal degradation.
  • Guaranteed Results: Specifications apply when used with the TERS_S standard sample. Console lifespan: approximately 3 months.

Contact us to learn more or get a recommendation for your specific needs.

Special AFM PROBES

We offer a wide range of special AFM probes for mechanical, electrical, and chemical surface measurements — including diamond-coated, metal-coated, super-sharp, high aspect ratio probes, and many more.

Contact us to learn more or get a recommendation for your specific needs.