AFM Characterization Services
We offer advanced AFM characterization services with nano-scale precision, perfect for a wide range of applications including tomography, CFM, MFM, EFM, PFM, and more. Whether you’re studying the topography, mechanical, or electrical properties of materials, our AFM services provide detailed insights into samples like thin films, biological materials, semiconductors, and nanostructures. Each service is tailored to meet the specific needs of your research, and pricing is available upon request. Contact us to discuss how we can support your projects with high-quality AFM analysis.
SEM Characterization Services
Our SEM services provide high-resolution imaging and detailed surface analysis, ideal for examining the morphology, composition, and structure of a wide range of materials. With advanced capabilities in secondary electron imaging, backscattered electron imaging, and energy dispersive X-ray spectroscopy (EDX), we can help characterize everything from nanomaterials to bulk samples. Pricing is available upon request. Reach out to discuss how our SEM analysis can enhance your research.
STEM Characterization Services
We offer advanced STEM analysis with atomic-scale resolution, including BF, ABF, and HAADF imaging modes. Our capabilities also include atomic-resolution EELS for precise chemical mapping at the nanoscale. Ideal for materials science, nanotechnology, and interface studies. Pricing upon request—feel free to contact us to discuss your sample and analytical needs.