NTEGAR AFM serise
PRIMA
A universal scanning probe microscope implementing more than 40 methods of atomic force and tunneling microscopy. The functionality of the basic model can be significantly expanded; the microscope can be easily integrated with other analytical methods into more complex measurement systems.
ACADEMIA
A modern technological solution for use in the educational process, studying the basics, developing work skills and mastering the basic techniques of scanning probe microscopy in AFM/STM modes.
AURA
Scanning Probe Microscope for operation in controlled atmosphere and low vacuum conditions. In vacuum, the cantilever oscillation quality increases, and the sensitivity and accuracy in measuring the interaction of weak forces between the probe and the sample increase. At the same time, the transition from atmospheric pressure to a vacuum of 10
-2 Torr provides an almost tenfold increase in the cantilever oscillation quality. A further increase in the vacuum depth does not lead to a significant increase in the quality factor.
MFM
Scanning probe microscope for experiments in air, in controlled atmosphere conditions, in low vacuum conditions.
VITA
A modular system on a single hardware and software platform for solving many different experimental problems in life sciences.
SPECTRA
Simultaneous and colocalized study of samples by SPM and Raman microscopy/spectroscopy. Complete physicochemical analysis of the studied sample.
AFM Probes
A wide selection of AFM probes tailored for various applications, from standard topography to advanced electrical, magnetic, and mechanical measurements.